✦ LIBER ✦
Polarity Balanced Driving Scheme to Suppress the Degradation of Vth in a-Si:H TFT Due to the Positive Gate Bias Stress for AMOLED
✍ Scribed by Bong-Hyun You; Jae-Hoon Lee; Min-Koo Han
- Book ID
- 115368559
- Publisher
- Institute of Electrical and Electronics Engineers
- Year
- 2007
- Tongue
- English
- Weight
- 764 KB
- Volume
- 3
- Category
- Article
- ISSN
- 1551-319X
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