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Point defects in active layers of TFEL devices based on ZnS

✍ Scribed by Zhidong Lou; A. N. Georgobiani; Zheng Xu; Chunxiang Xu; Feng Teng; Lei Yu; Xurong Xu

Book ID: 105641645
Publisher: Springer
Year: 1998
Tongue: English
Weight: 430 KB
Volume: 43
Category: Article
ISSN: 1001-6538
DOI: 10.1007/bf02883825

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