✦ LIBER ✦
Point defects analysis of zinc oxide thin films annealed at different temperatures with photoluminescence, Hall mobility, and low frequency noise
✍ Scribed by Ke, Lin; Lai, Szu Cheng; Ye, Jian Dong; Kaixin, Vivian Lin; Chua, Soo Jin
- Book ID
- 125526626
- Publisher
- American Institute of Physics
- Year
- 2010
- Tongue
- English
- Weight
- 761 KB
- Volume
- 108
- Category
- Article
- ISSN
- 0021-8979
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