Point defect charge determination by ionic polarization of semiconducting oxides with special reference to TiO2−x

✍ Scribed by F.A. Kröger

• Publisher: Elsevier Science
• Year: 1985
• Tongue: English
• Weight: 150 KB
• Volume: 15
• Category: Article
• ISSN: 0167-2738
• DOI: 10.1016/0167-2738(85)90104-3