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Point-Contact Spectroscopy on the Ce(CuxAl1 –x)5 System

✍ Scribed by Nozar, P. ;Sechovsky, V. ;Solanki-Moser, M. ;Bauer, E. ;Gratz, E.


Book ID
105381832
Publisher
John Wiley and Sons
Year
1990
Tongue
English
Weight
385 KB
Volume
117
Category
Article
ISSN
0031-8965

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Structure and electrical properties of Ce-doped Ba(Zr x Ti 1Àx )O 3 (BCZT) thin films with the mole fraction of x ¼ 0:2 and the thickness of about 100 nm have been investigated. Ce-doped BZT films were prepared on Pt/Ti/SiO 2 /Si substrates by a RF magnetron sputtering system. X-ray diffraction patt