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Plasmas for the Low-Temperature Growth of High-Quality GaN Films by Molecular Beam Epitaxy and Remote Plasma MOCVD

โœ Scribed by Losurdo, M. ;Capezzuto, P. ;Bruno, G. ;Namkoong, G. ;Doolittle, W.A. ;Brown, A.S.


Publisher
John Wiley and Sons
Year
2002
Tongue
English
Weight
273 KB
Volume
190
Category
Article
ISSN
0031-8965

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Temperature Dependence of the Photorefle
โœ Behn, U. ;Thamm, A. ;Brandt, O. ;Grahn, H.T. ๐Ÿ“‚ Article ๐Ÿ“… 2000 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 101 KB ๐Ÿ‘ 2 views

The photoreflectance (PR) lineshape of GaN films grown by molecular beam epitaxy was investigated in the temperature range of 10 to 400 K. At low temperatures, the lineshape is dominated by excitonic transitions and can be reasonably well fitted using the first derivative of a Gaussianbroadened osci