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Plasma Surface Modification of Fluoropolymers Studied by ToF-SIMS

✍ Scribed by D. Léonard; P. Bertrand; M. K. Shi; E. Sacher; L. Martinu

Book ID
110412335
Publisher
Springer
Year
1999
Tongue
English
Weight
878 KB
Volume
4
Category
Article
ISSN
1084-0184

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The combination of time-of-Ñight secondary mass spectrometry (ToF-SIMS) and monochromatized x-ray photoelectron spectroscopy (XPS) has proved to be a valuable tool for the analysis of chemically modiÐed polymer surfaces. By applying these techniques in situ, together with a plasma modiÐcation chambe