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Plasma-etched depth measurement of films using the diffraction of a lamellar grating

โœ Scribed by Geraldo F. Mendes; Lucila Cescato; Jaime Frejlich; Edmundo S. Braga; Alaide P. Mammana


Publisher
Elsevier Science
Year
1984
Tongue
English
Weight
511 KB
Volume
117
Category
Article
ISSN
0040-6090

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