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Plasma-charging effects on submicron MOS devices

✍ Scribed by Pei-Jer Tzeng; Chang, Y.-Y.I.; Chun-Chen Yeh; Chih-Chiang Chen; Chien-Hung Liu; Mu-Yi Liu; Bone-Fong Wu; Kuei-Shu Chang-Liao

No coin nor oath required. For personal study only.

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