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Plasma-assisted chemical vapor deposited silicon oxynitride as an alternative material for gate dielectric in MOS devices

✍ Scribed by A. Szekeres; T. Nikolova; S. Simeonov; A. Gushterov; F. Hamelmann; U. Heinzmann


Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
243 KB
Volume
37
Category
Article
ISSN
0026-2692

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