Planning of aging experiments for semiconductor devices by means of the assurance test matrix : A. S. Jordan and T. D. O'Sullivan. Microelectron. Reliab. 24 (1), 125 (1984)

• Publisher: Elsevier Science
• Year: 1984
• Tongue: English
• Weight: 124 KB
• Volume: 24
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(84)90901-6