𝔖 Bobbio Scriptorium

✦ LIBER ✦

Planar irregularities of texture and stress field in Ti detected by X-ray diffraction technique

✍ Scribed by L. Tarkowski; J. Bonarski; I. Alexandrov

Publisher: Elsevier Science
Year: 2010
Tongue: English
Weight: 367 KB
Volume: 268
Category: Article
ISSN: 0168-583X
DOI: 10.1016/j.nimb.2009.09.049

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

X-ray diffraction stress analysis as an

X-ray diffraction stress analysis as an NDE technique : Pardue, E.B.S.; McSwain, R.H. Review of progress in quantitative nondestructive evaluation, Williamsburg, Virginia (United States), 22–26 Jun. 1987. Vol. 7B, pp. 1421–1428. Edited by D.D. Thompson and D.E. Chimenti, Plenum Press, 1988

📂 Article 📅 1989 🏛 Elsevier Science ⚖ 172 KB