Plagioclase preferred orientation by TOF neutron diffraction and SEM-EBSD

✍ Scribed by Yanxia Xie; Hans-Rudolf Wenk; Siegfried Matthies

• Book ID: 117225719
• Publisher: Elsevier Science
• Year: 2003
• Tongue: English
• Weight: 1022 KB
• Volume: 370
• Category: Article
• ISSN: 0040-1951
• DOI: 10.1016/s0040-1951(03)00191-4