PIXE (particle induced X-ray emission): A non-destructive analysis method adapted to the thin decorative coatings of antique ceramics

✍ Scribed by Y. Leon; Ph. Sciau; A. Bouquillon; L. Pichon; Ph. de Parseval

• Book ID: 119333540
• Publisher: Elsevier Science
• Year: 2012
• Tongue: English
• Weight: 533 KB
• Volume: 291
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/j.nimb.2012.09.010