𝔖 Bobbio Scriptorium
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PIXE analysis of compound materials

✍ Scribed by R. Kalish; G. Bahir


Publisher
Elsevier Science
Year
1983
Weight
331 KB
Volume
218
Category
Article
ISSN
0167-5087

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PIXE analysis of silk
✍ Yongcheng Liu; Tongyin Yu; Huiying Yao; Fujia Yang πŸ“‚ Article πŸ“… 1997 πŸ› John Wiley and Sons 🌐 English βš– 105 KB πŸ‘ 1 views

The method of proton-induced X-ray emission (PIXE) was first utilized to analyze the elements in silk. Different kinds of silk from home and the wild were examined. The results show that every silk, besides C, H, O, and N, contains many types of elements such as Si, P, S, Ca, Mn, Fe, Cu, Zn, and Sr