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Pion-induced damage in silicon detectors

✍ Scribed by S.J. Bates; C. Furetta; M. Glaser; F. Lemeilleur; E. León-Florián; C. Gößling; B. Kaiser; A. Rolf; R. Wunstorf; H. Feick; E. Fretwurst; G. Lindström; M. Moll; G. Taylor; A. Chilingarov

Book ID: 107925329
Publisher: Elsevier Science
Year: 1996
Tongue: English
Weight: 881 KB
Volume: 379
Category: Article
ISSN: 0168-9002
DOI: 10.1016/0168-9002(96)00538-4

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