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Pinning Field Distribution and Microstructural Study of Thermal Annealed Fe-Nb-Cu-Si-B Wires

✍ Scribed by Olivera, J.; Ipatov, M.; Sanchez, M.L.; Prida, V.M.; Varga, R.; Hernando, B.; Zhukov, A.

No coin nor oath required. For personal study only.

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