Piezoelectric evaluation of ion beam etched Pb(Zr,Ti)O3 thin films by piezoresponse force microscopy

✍ Scribed by C. Legrand; A. Da Costa; R. Desfeux; C. Soyer; D. Rèmiens

• Publisher: Elsevier Science
• Year: 2007
• Tongue: English
• Weight: 393 KB
• Volume: 253
• Category: Article
• ISSN: 0169-4332
• DOI: 10.1016/j.apsusc.2006.10.076