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Piezoelectric Coefficient Measurements in Ferroelectric Single Crystals Using High Voltage Atomic Force Microscopy

✍ Scribed by Agronin, Alex G.; Rosenwaks, Yossi; Rosenman, Gil I.


Book ID
126859735
Publisher
American Chemical Society
Year
2003
Tongue
English
Weight
71 KB
Volume
3
Category
Article
ISSN
1530-6984

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The equilibrium sizes of micro-and nano-domains caused by electric field of atomic force microscope tip in ferroelectricsemiconductor crystals have been calculated. The domain was considered as a prolate semi-ellipsoid with rather thin domain walls. For the first time we modified the Landauer model