๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Piezoelectric coefficient measurement of piezoelectric thin films: an overview

โœ Scribed by J.-M. Liu; B. Pan; H.L.W. Chan; S.N. Zhu; Y.Y. Zhu; Z.G. Liu


Book ID
114193023
Publisher
Elsevier Science
Year
2002
Tongue
English
Weight
227 KB
Volume
75
Category
Article
ISSN
0254-0584

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


Piezoelectric activity of thin PTZ films
โœ S. V. Biryukov; Yu. I. Golovko; S. I. Masychev; V. M. Mukhortov; A. P. Shelepo ๐Ÿ“‚ Article ๐Ÿ“… 2009 ๐Ÿ› Springer ๐ŸŒ English โš– 162 KB
Extraction of electromechanical coupling
โœ Qing-Biao Zhou; Yue-kai Lu; Shu-Yi Zhang ๐Ÿ“‚ Article ๐Ÿ“… 2001 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 144 KB

A method to extract the electromechanical couplig coecient k 2 t of the thickness extensional mode of a piezoelectric thin ยฎlm deposited on a substrate is presented, in which a two-layer structure is as a composite resonator. Based on the method proposed by Wang et al. (IEEE Trans. UFFC 46 (1999) 13