✦ LIBER ✦
Piecewise regression model construction with sample efficient regression tree (SERT) and applications to semiconductor yield analysis
✍ Scribed by Amos Hong; Argon Chen
- Book ID
- 118479035
- Publisher
- Elsevier Science
- Year
- 2012
- Tongue
- English
- Weight
- 928 KB
- Volume
- 22
- Category
- Article
- ISSN
- 0959-1524
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