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Physics with Highly-Charged Ions in an EBIT

✍ Scribed by J. R. Crespo López-Urrutia; B. Bapat; I. Draganić; B. Feuerstein; D. Fischer; H. Lörch; R. Moshammer; J. Ullrich; R. D. DuBois; Y. Zou

Book ID
111585523
Publisher
Springer
Year
2003
Tongue
English
Weight
51 KB
Volume
146/147
Category
Article
ISSN
0304-3843

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Few-electron ions, which can be produced and studied at rest in electron beam ion traps (EBITs) are very well suited for the study of nuclear size effects and QED in strong fields, but the various contributions are usually entangled. Therefore, combinations of experiments with ions in different char