Physics of thin films: Edited by Maurice H Francombe and John L Vossen Vol 17. Advances in research and development: Mechanic and dielectric properties. Academic Press Inc., New York, 1993. ISBN 0-12-533-017-0, 397 pp. price £83.00; $109.50

✍ Scribed by W Steckelmacher

• Publisher: Elsevier Science
• Year: 1995
• Tongue: English
• Weight: 164 KB
• Volume: 46
• Category: Article
• ISSN: 0042-207X
• DOI: 10.1016/0042-207x(95)80057-3