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Physics-Based Analysis and Simulation of Noise in MOSFETs Under Large-Signal Operation

✍ Scribed by Sung-Min Hong; Chan Hyeong Park; Young June Park; Hong Shick Min

Book ID
114619946
Publisher
IEEE
Year
2010
Tongue
English
Weight
372 KB
Volume
57
Category
Article
ISSN
0018-9383

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