Physical model of the interference immunity of electronic devices and conclusions concerning their testing and operating characteristics
✍ Scribed by H. Bauer; G. Hentschel
- Publisher
- John Wiley and Sons
- Year
- 2007
- Tongue
- English
- Weight
- 634 KB
- Volume
- 10
- Category
- Article
- ISSN
- 1430-144X
No coin nor oath required. For personal study only.
✦ Synopsis
Abstract
Switching and fault processes in power‐supply systems cause pulse‐shaped disturbances which may stress electronic devices of protection and control systems. For test purposes such disturbances can be simulated. But despite of the constant test conditions the reaction of the device on the disturbance can vary in a certain range. Assuming similar internal structures of protection and control devices the coupling path and the effects of the disturbance are described. The variation in device reaction due to the disturbance is explained on the basis of different models which imitate the impact of the disturbances especially on the logical part of the circuit. By applying sensors with constant threshold the effectiveness (function) of several EMC measures can be evaluated independently from the reaction of the special device.