✦ LIBER ✦
Physical characterization of OMVPE-grown AlxGa1-xAs multi-layer films by means of non-destructive optical reflectometry
✍ Scribed by Pieter L. Swart; Beatrys M. Lacquet; Rajan Thavar
- Publisher
- Elsevier Science
- Year
- 1991
- Tongue
- English
- Weight
- 443 KB
- Volume
- 50
- Category
- Article
- ISSN
- 0169-4332
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