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Physical characterization of In2Se3 thin films prepared by electron beam evaporation

✍ Scribed by D Manno; G Micocci; R Rella; P Siciliano; A Tepore


Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
767 KB
Volume
46
Category
Article
ISSN
0042-207X

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Quinizarin (1,4-DHAQ) thin films deposited under vacuum were invesligated by IR absorption, X-ray diffraction, nuclear magnetic resonance (NMR), optical absorption, electron spectroscopy for chemical analysis elemental analysis (XPS), and scanning electron microscopy and melting point measurements.