✦ LIBER ✦
Physical aspects of electron microscopy and microbeam analysis: Jointly sponsored by the Electron Microscopy Society of America and the Microbeam Analysis Society. Edited by Benjamin M. Siegel and Donald R. Beaman. Wiley, New York, 1975. xiii + 474 pp. $32.50
✍ Scribed by Al Steyermark
- Book ID
- 107828692
- Publisher
- Elsevier Science
- Year
- 1976
- Tongue
- English
- Weight
- 132 KB
- Volume
- 21
- Category
- Article
- ISSN
- 0026-265X
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