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Physical aspects of electron microscopy and microbeam analysis: Jointly sponsored by the Electron Microscopy Society of America and the Microbeam Analysis Society. Edited by Benjamin M. Siegel and Donald R. Beaman. Wiley, New York, 1975. xiii + 474 pp. $32.50

✍ Scribed by Al Steyermark


Book ID
107828692
Publisher
Elsevier Science
Year
1976
Tongue
English
Weight
132 KB
Volume
21
Category
Article
ISSN
0026-265X

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