Small-angle X-ray scattering studies of
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Q. Deng; K. M. Cable; R. B. Moore; K. A. Mauritz
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Article
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1996
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John Wiley and Sons
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English
⚖ 805 KB
The small angle X-ray scattering technique was used to probe structural heterogeneity on the scale of nanometers within Nafion@/[silicon oxide], Nafion@/[ORMOSIL], and Nafion@/[dimethylsiloxane] hybrid membranes. The results of this study reinforced the working hypothesis of morphological template a