Physical analysis of stress testing for failure of electronic components : C. F. Kooi, IEEE Trans. Reliab.R17, June (1968), p. 80

• Book ID: 103269711
• Publisher: Elsevier Science
• Year: 1969
• Tongue: English
• Weight: 100 KB
• Volume: 8
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(69)90039-0