Photovoltaic Modules: Technology and Reliability

✍ Scribed by Harry Wirth; Karl-Anders Weiß; Cornelia Wiesmeier

• Publisher: De Gruyter
• Year: 2016
• Tongue: English
• Leaves: 224
• Category: Library

✦ Synopsis

Photovoltaic Modules: Technology and Reliability provides unique insights into concepts, material design strategies, manufacturing techniques, quality and service life analysis of wafer-based photovoltaic modules. Taking an interdisciplinary approach, the authors focus on two main topics. Part I – Crystalline Silicone Module Technology offers photovoltaics fundamentals: solar cell properties, module design, materials and production, basic module characterization, module power as well as efficiency and module performance. Part II, on the other hand, illustrates the state-of-the-art of module reliability by characterization of modules and degradation effects, examination of PV-Module loads, accelerated aging tests as well as reliability testing of materials and modules. A separate chapter is dedicated to PV module and component certification.

• About 100 million wafer-based photovoltaic modules are sold annually.
• Module technology increases lifetime of solar cells to about 25 years and enables their use in almost all climate zones.
  

✦ Table of Contents

Preface
Contents
Symbols and units
Part I: Crystalline Silicon Module Technology
1 Introduction
2 Solar cell properties
2.1 Types of solar cells
2.2 IV parameters and the electricmodel
2.2.1 IV curve
2.2.2 One-diode model
2.2.3 Deriving circuit parameters from measuredIV curves
2.2.4 Two-diode model with reverse breakdown
2.3 Cell efficiency
2.4 Spectral response
2.5 Temperature coefficients for cell power
2.6 Low light response
2.7 Mechanical properties
2.8 Thermomechanical properties
2.9 Cellmetallization and contact pads
2.9.1 Front-to-back contact cells
2.9.2 Back contact cells
2.10 Antireflective texturing and coating
3 Module design, materials, and production
3.1 Cell interconnection
3.1.1 Ribbons and wires
3.1.2 Structured interconnectors
3.1.3 Conductive backsheet
3.1.4 Cell shingling
3.1.5 Soldering processes
3.1.6 Solders
3.1.7 Electrically conductive adhesives
3.1.8 Joint characterization
3.2 Covers and encapsulants
3.2.1 Front cover
3.2.2 Rear cover
3.2.3 Encapsulants
3.2.4 Edge sealed designs without encapsulant
3.2.5 Laminate characterization
3.3 Junctions and frame
3.4 Module production
3.4.1 Production process
3.4.2 Production equipment
3.5 Module recycling
4 Basic module characterization
4.1 Light IV measurement
4.2 Energy rating
4.3 Dark IV measurement
4.4 Electroluminescence imaging
5 Module power and efficiency
5.1 IV parameters and electricmodel
5.2 Partial shading and hot-spots
5.3 Power and efficiencymodel
5.4 Geometrical effects
5.5 Optical effects
5.5.1 Air/glass and glass/encapsulant interface reflection (f1, f3)
5.5.2 Glass and encapsulant bulk absorption (f2, f4)
5.5.3 Active area interface reflection (f5)
5.5.4 Active area multiple reflection (f6)
5.5.5 Finger multiple reflection (f7)
5.5.6 Cell interconnector shading and multiple reflection (f8)
5.5.7 Cell-spacingmultiple reflection (f9)
5.6 Electrical effects
5.6.1 Cellmismatch (f10)
5.6.2 Series resistance losses (f11, f12, f13)
5.7 Comprehensivemodel
6 Module performance
6.1 Irradiationmodels
6.2 Temperature effects
6.3 Irradiance level
6.4 Irradiance angle
6.4.1 Incidence angle modifiers
6.4.2 Angular distribution of radiation
6.5 Irradiance spectrum
6.6 Bifacial irradiance
6.7 Energy payback time
7 References
Part II: Crystalline Silicon Module Reliability
8 Characterization of modules and degradation effects
8.1 Destructive analytics
8.1.1 Gel content analysis
8.1.2 Differential scanning calorimetry DSC
8.1.3 Dynamic mechanical analysisDMA
8.1.4 Energy-dispersive x-ray spectroscopy EDX
8.1.5 Auger electron spectroscopy AUGER
8.1.6 Peel testing
8.2 Non-destructive analytics
8.2.1 IV-curve measurements
8.2.2 Internal and external quantum efficiency IQE and EQE measurements
8.2.3 Photoluminescence PL imaging
8.2.4 Gloss- and colour measurement
8.2.5 Raman spectroscopy
8.2.6 Nanoindentation
8.2.7 Fourier-Transform FT-IR/UV/vis measurement
8.2.8 Scanning acoustic microscopy SAM
9 Loads for PV Modules
9.1 External loads
9.1.1 UV-radiation
9.1.2 Temperature
9.1.3 Humidity
9.1.4 Mechanical loads
9.1.5 Corrosivity
9.1.6 Other chemical loads
10 Accelerated aging tests
10.1 Light sources
10.2 Climatic chambers
10.3 Procedures
11 Reliability testing of materials
11.1 Equipment
11.2 Procedures
12 Reliability testing of modules
12.1 Equipment
12.2 Procedures
13 PV module and component certification
13.1 Type approval testing IEC 61215
13.2 Safety testing IEC 61730
14 References
Index