Photoreflectance of strained Si1-xGex epilayers (0.07≤x≥0.26) and comparison with spectroscopic ellipsometry

✍ Scribed by R.T. Carline; C. Pickering; T.J.C. Hosea; D.J. Robbins

• Publisher: Elsevier Science
• Year: 1994
• Tongue: English
• Weight: 653 KB
• Volume: 81
• Category: Article
• ISSN: 0169-4332
• DOI: 10.1016/0169-4332(94)90053-1