Photon band gap properties and omnidirectional reflectance in Si∕SiO[sub 2] Thue–Morse quasicrystals

✍ Scribed by Dal Negro, L.; Stolfi, M.; Yi, Y.; Michel, J.; Duan, X.; Kimerling, L. C.; LeBlanc, J.; Haavisto, J.

• Book ID: 120313341
• Publisher: American Institute of Physics
• Year: 2004
• Tongue: English
• Weight: 568 KB
• Volume: 84
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.1764602