Photoluminescence Intensity and Spectral Distribution of GaN Films on SiC Substrates — The Dependence on Dislocation Density and Structure

✍ Scribed by P. Hacke; A. Kuramata; K. Domen; K. Horino; T. Tanahashi

• Publisher: John Wiley and Sons
• Year: 1999
• Tongue: English
• Weight: 165 KB
• Volume: 216
• Category: Article
• ISSN: 0370-1972
• DOI: 10.1002/(sici)1521-3951(199911)216:1<639::aid-pssb639>3.0.co;2-0