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Photoluminescence fatigue and related degradation in thin-film photovoltaics

โœ Scribed by Shvydka, Diana; Verzella, C.; Karpov, V. G.; Compaan, A. D.


Book ID
120082345
Publisher
American Institute of Physics
Year
2003
Tongue
English
Weight
363 KB
Volume
94
Category
Article
ISSN
0021-8979

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## Abstract Exploiting the potential of the material for the photovoltaic applications requires an extensive defect level analysis, mandatory. Photoluminescence (PL) technique was employed to probe the defect levels in pโ€SnS thin films deposited using chemical spray pyrolysis (CSP) technique. Three