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Photoionization measurement of deep defects in single-crystalline CVD diamond using the transient-current technique

✍ Scribed by Isberg, J.; Tajani, A.; Twitchen, D. J.


Book ID
121343938
Publisher
The American Physical Society
Year
2006
Tongue
English
Weight
523 KB
Volume
73
Category
Article
ISSN
1098-0121

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