Photoelectron spectroscopy versus absorption spectroscopy for quantitative characterization of nanometric powders coated with an overlayer
✍ Scribed by S�nchez-L�pez, J. C.; Fern�ndez, A.
- Publisher
- John Wiley and Sons
- Year
- 1998
- Tongue
- English
- Weight
- 450 KB
- Volume
- 26
- Category
- Article
- ISSN
- 0142-2421
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✦ Synopsis
For the present study we have considered powders made up of small particles (AE1 lm) coated with a uniform overlayer. Di †erent models have been developed to predict the elemental compositions in this kind of sample by x-ray photoelectron spectroscopy (XPS) and absorption spectroscopies : electron energy-loss spectroscopy (EELS) and x-ray absorption spectroscopy (XAS). Isolated spherical or cubic particles, aggregated spherical particles and continuously layered models have been considered to take di †erent possible textures of the samples into account. Theoretical curves have been compared to experimental data obtained for ultraÐne powders made up of Al 2 O 3 /Al Al metal cores coated with an overlayer. The dependence of both photoelectron and absorption spectroscopy Al 2 O 3 analysis on overlayer thickness and sample texture as a function of particle size is discussed.