Photoelectron spectroscopy of thin-film
Photoelectron spectroscopy of thin-film Yb-Si(100) structures formed by solid phase epitaxy at 800 K
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D. V. Vyalikh; M. V. Kuzmin; M. A. Mittsev; S. L. Molodtsov
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Article
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2004
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SP MAIK Nauka/Interperiodica
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English
β 48 KB