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Photoelectric Laser Stimulation applied to Latch-Up phenomenon and localization of parasitic transistors in an industrial failure analysis laboratory

✍ Scribed by R. Llido; J. Gomez; V. Goubier; N. Froidevaux; L. Dufayard; G. Haller; V. Pouget; D. Lewis


Book ID
113800518
Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
690 KB
Volume
51
Category
Article
ISSN
0026-2714

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