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Photochemical fine etching using FIB-induced damage in GaAs for in-situ dry processing

✍ Scribed by H. Arimoto; M. Kosugi; H. Kitada; E. Miyauchi


Book ID
107920385
Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
384 KB
Volume
9
Category
Article
ISSN
0167-9317

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