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Photocarrier drift mobility in ZnO at low temperature

โœ Scribed by Hiroyuki Yamaguchi; Yousuke Ishidsuka; Takao Komiyama; Yasunori Chonan; Takashi Aoyama


Book ID
112182426
Publisher
John Wiley and Sons
Year
2012
Tongue
English
Weight
335 KB
Volume
9
Category
Article
ISSN
1862-6351

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๐Ÿ“œ SIMILAR VOLUMES


Dislocation mobility in LiF at low tempe
โœ Prof. Dr. Takayoshi Suzuki; Kazuo Nakamura ๐Ÿ“‚ Article ๐Ÿ“… 1984 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 460 KB

Dedicated to Professor V. I. STARTSEV on the occasion of his 70th birthday The mobility of dislocations in LiF has been measured a t 4.2 and 10 K by means of an etch pit technique. The average velocity of screw dislocations is 2-5 times as large as edge dislocations. The results of the stress and t