𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Photo-induced current measurement for the characterized of deep-level traps in lattice-matched MODFETs on InP substrate

✍ Scribed by Roberto Sung; Mukunda B. Das


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
609 KB
Volume
35
Category
Article
ISSN
0038-1101

No coin nor oath required. For personal study only.