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Phenomenological Studies of the Low Energy Dynamics in theppK+K−System

✍ Scribed by Silarski, M.


Book ID
125349695
Publisher
Springer Vienna
Year
2013
Tongue
English
Weight
166 KB
Volume
55
Category
Article
ISSN
0177-7963

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This paper describes a new application in cultural heritage and other areas for a highly surface specific analytical technique originally developed for semiconductor research. The technique, ultra-low-energy dynamic secondary ion mass spectrometry (uleSIMS), is microdestructive, but has a sensitivit