Growth of thin Ti films on Al single-cry
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Smith, R. J.; Kim, Y. W.; Shivaparan, N. R.; White, G. A.; Teter, M. A.
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Article
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1999
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John Wiley and Sons
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English
β 264 KB
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The growth of thin Ti Γlms on Al(001), Al(110) and Al(111) surfaces at room temperature has been studied using high-energy Rutherford backscattering spectroscopy (RBS) and channeling, x-ray photoelectron spectroscopy (XPS) and low-energy electron di β raction (LEED). Our results show that Ti atoms fo