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Phase separation in thick InGaN layers – A quantitative, nanoscale study by pulsed laser atom probe tomography

✍ Scribed by M. Müller; G.D.W. Smith; B. Gault; C.R.M. Grovenor


Book ID
113415988
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
888 KB
Volume
60
Category
Article
ISSN
1359-6454

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