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Phase modulated ellipsometry used for composition control during MBE growth of CdHgTe: An analysis of instrumental factors and an assessment of the material produced

✍ Scribed by R. H. Hartley; M. A. Folkard; D. Carr; P. J. Orders; G. Shen; V. Kumar; T. A. Steele; I. K. Varga; B. A. Johnson; K. Fueloop; P. Capper; D. Dutton; S. Barton; I. Gale; F. Grainger


Book ID
112814964
Publisher
Springer US
Year
1996
Tongue
English
Weight
683 KB
Volume
25
Category
Article
ISSN
0361-5235

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