A simplified mode of differential phase contrast Lorentz microscopy for the study of magnetic domain structures in thin films is proposed and demonstrated. This mode employs a single annular detector in a scanning transmission electron microscope rather than the specialized split detectors that have
β¦ LIBER β¦
Phase contrast surface mode resonance microscopy
β Scribed by S. Herminghaus; C. Bechinger; W. Petersen; P. Leiderer
- Publisher
- Elsevier Science
- Year
- 1994
- Tongue
- English
- Weight
- 497 KB
- Volume
- 112
- Category
- Article
- ISSN
- 0030-4018
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