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Phase coexistence in the metal–insulator transition of a VO2 thin film

✍ Scribed by Y.J. Chang; C.H. Koo; J.S. Yang; Y.S. Kim; D.H. Kim; J.S. Lee; T.W. Noh; Hyun-Tak Kim; B.G. Chae


Book ID
108287750
Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
364 KB
Volume
486
Category
Article
ISSN
0040-6090

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