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Phase characterization of the reflection on an extreme UV multilayer: comparison between attosecond metrology and standing wave measurements

✍ Scribed by Loch, R. A.; Dubrouil, A.; Sobierajski, R.; Descamps, D.; Fabre, B.; Lidon, P.; van de Kruijs, R. W. E.; Boekhout, F.; Gullikson, E.; Gaudin, J.


Book ID
115435213
Publisher
Optical Society of America
Year
2011
Tongue
English
Weight
255 KB
Volume
36
Category
Article
ISSN
0146-9592

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