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Phase change induced degradation of amorphous vanadium oxide cathode thin film during charge-discharge

✍ Scribed by H. Y. Park; S. R. Lee; W. I. Cho; H. K. Kim; S. M. Lee; J. S. Kim; Y. S. Yoon


Publisher
TechnoPress
Year
2003
Tongue
English
Weight
297 KB
Volume
9
Category
Article
ISSN
1598-9623

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